Fast Facts: Highly Accelerated Life Testing- HALT

• During the HALT Process, a product is subject to increasing stress levels of temperature and vibration (independently and in combination), rapid thermal transitions, and other stresses specifically related to the operation of your product.

The information goals of HALT are to:

• Determine multiple failure modes and root causes
• Determine functional operating limits
• Determine functional destruct limits
• Focuse on thermal and vibration stresses (first separately, then combined)

HALT was developed specifically for solid state electronics, but can be applied to any product, with the correct equipment. In general, the information goal of HALT is most effectively met by testing at the lowest possible sub-assembly:

• Consider a balance between a "functional assembly" and determining the technological limit of a product feature
• Consider removing structure that dampens vibration or blocks air flow; reducing the applied stresses to sub-assemblies
• Consider that loss of critical circuitry or connections may affect the sub-assembly tested

>> Highly Accelerated Stress Screen- HASS
Once the HALT process has been completed, and the product has been ruggedized, Intertek can develop a custom production screen to identify process defects.
Running HASS:

• Apply all stresses simultaneously. During vibration, continuously ramp temperature between brief dwells at extremes.
• HASS Stress levels are based on HALT limits.
• Include any "critical" additional product stresses (as determined from HALT, e.g. product power)
• Conduct precipitation screen and evaluate product beyond operating limits, near destruct limits.
• Precipitate failures in product due to "latent" defects.
• Conduct detection screen and evaluate product near operating limits. Confirm and explore precipitation screen failures, and other hard and soft failures.

HALT/HASS Results identify/precipitate/eliminate failures due to:

• Poor solder quality
• Socket failures
• Bent or broken leads
• Incorrect or missing components
• Incorrect component location
• Failed fixtures
• Program errors
• Loose, missing, failed fasteners
• Lifted pins
• Worn, broken connectors
• Intermittent connections

HALT/HASS Product Applications:

• Electronic Circuit Boards
• Electronic Sub-assemblies
• Electronic Components

Why Intertek?

Through accelerated testing Intertek will work with you to uncover design defects or weaknesses that may not have been realized during product design. Through simulated “real-life” conditions, accelerated testing will provide you with the data necessary to evaluate recent or proposed product changes, and ensure the reliability of your products. Intertek strives to show you how accelerated testing can save both time and money for various applications without making the setup and test execution complex.

To begin your testing project, contact us today.